Properties of physically deposited thin aluminium film coatings: A review

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dc.contributor.author Mwema, Fredrick Madaraka
dc.contributor.author Oladijo, Oluseyi Philip
dc.contributor.author Akinlabi, Stephen A
dc.contributor.author Akinlabi, Esther Titilayo
dc.date.accessioned 2019-06-13T05:48:55Z
dc.date.available 2019-06-13T05:48:55Z
dc.date.issued 2018-03-01
dc.identifier.citation 10.1016/j.jallcom.2018.03.006 en_US
dc.identifier.uri http://41.89.227.156:8080/xmlui/handle/123456789/896
dc.description.abstract Aluminium thin films exhibit excellent coating properties suitable for optical, microelectronics, telecommunications and constructional/structural applications. Thin aluminium film deposition is mainly accomplished via physical or chemical methods at varying deposition conditions, parameters and substrates. This study focuses on thin aluminium films prepared using physical methods which have superior properties to chemical methods and are extensively researched in the published literature. The review discusses the properties of thin aluminium films and their complex interactions with process parameters. The properties of thin films depend on the deposition parameters which include substrate temperature, deposition rate, power, process pressure, substrate surface finish, and target temperature. Post-deposition treatment of the films and the type of substrate also influence the properties of thin films. This review therefore highlights the significance of optimising the deposition methods and identifies research gaps in the published studies. The work can be a primary resource for selection of essential process parameters during physical deposition aluminium films. en_US
dc.language.iso en en_US
dc.publisher Journal of Alloys and Compounds en_US
dc.subject aluminium, thin films, corrosion, electrical, optical, physical deposition, properties en_US
dc.title Properties of physically deposited thin aluminium film coatings: A review en_US
dc.type Article en_US


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