Abstract:
In this article, simulated/artificial surfaces consisting of perfectly
ordered and mounded (perfect) structures and defective surfaces are
characterised through statistical and fractal methods. The image sizes are
designed to mimic atomic force microscopy (AFM) of scan area 1 μm
and
maximum height features of 500 nm. The simulated images are then
characterised using statistical tools such as root mean square and average
roughness, skewness, kurtosis, and maximum pit and peaks. Fractal analyses
are also undertaken using fractal dimensions, autocorrelation, height-height
correlation and power spectral density functions. The results reveal
significant differences between defective and perfectly ordered and
mounded surfaces. The defective surfaces exhibit higher roughness values
and lower fractal dimensions values as compared to the perfect surfaces. The
results in this article can help researchers to better explain their results on
topography and surface evolution of thin films.
