Multi-frequency microwave response to periodic rougheness

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dc.contributor.author Kuria, David Ndegwa
dc.contributor.author Lu, Hui
dc.contributor.author Koike, Toshio
dc.contributor.author Tsutsui, Hiroyuki
dc.contributor.author Graf, Tobias
dc.date.accessioned 2022-11-14T12:54:22Z
dc.date.available 2022-11-14T12:54:22Z
dc.date.issued 2006-07-07
dc.identifier.uri http://repository.dkut.ac.ke:8080/xmlui/handle/123456789/7649
dc.description.abstract A series of field experiments were conducted to verify the effects of roughness on passive microwave emission. From these field experiments, it was observed that surface roughness increases observed brightness temperatures (higher emissivity) at horizontal polarization while diminishing the vertically polarized brightness temperatures marginally. The advanced integral equation method (AIEM) and QP models were found to model the effects of surface roughness fairly reasonably. The QP model which is a parameterized version of the AIEM was found to show correspondence with the AIEM simulations and is therefore recommended for application in AMSR based data assimilation schemes. en_US
dc.language.iso en en_US
dc.publisher IEEE en_US
dc.subject surface scattering; surface roughness; emission model; soil moisture en_US
dc.title Multi-frequency microwave response to periodic rougheness en_US
dc.type Article en_US


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