Browsing Mechanical Engineering by Subject "Atomic force microscopy, fourier transforms, power spectral density, surface roughness, thin films"

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Browsing Mechanical Engineering by Subject "Atomic force microscopy, fourier transforms, power spectral density, surface roughness, thin films"

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  • Mwema, Fredrick Madaraka; Akinlabi, Esther Titilayo; Oladijo, Oluseyi Philip (Photoenergy and Thin Film Materials, 2019-03-25)
    A step-by-step framework for undertaking PSD characterization of the surface topography of radio frequency (rf) magnetron sputtered thin Al films is presented in this chapter. The work aims to illustrate the significance ...

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