Abstract:
Biometric authentication system has become a mainstream solution across industries and devices. From
securing highly confidential data to unlocking smartphones, biometrics have eliminated the hassle of remembering
multiple complex passwords and PINs. It means that nobody can gain access to a device or system without your
presence. This paper discusses a method which could be used in the testing process of biometric systems on the side
of users and customers. Large –scale biometric systems traditionally undergo a series of tests beyond technology and
scenario testing. These large-scale system tests are typically at the system level, not just the biometric subsystem
level, and occur multiple times in the life of a system insuch forms as factory acceptance tests before shipment, site or
system acceptance tests beforeinitiating operations, and in- use tests to ensure that performance remains at acceptable
levels and/or to reset thresholds or other technical parameters. The conventional statistical methods use the binomial
distribution to estimate the expected number of failure, but in the field of the biometrics the probability parameter
can’t be constant which means that it is necessary to describe a process. The results have shown that the probability
is characterized with two parameters of the beta distribution, and these are predictable from a smaller sample of the
investigated population with the maximum likelihood method.
