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Sophisticated Cropping Patterns Mapping in Kenya Using Vegetation Indices and Phenology from Sentinel-2 and Sentinel-1 Radar Backscatter Data
Sichangi, Arthur Wafula
;
Grace Aduvukha
;
Elfatih Abdel-Rahman
;
Godfrey Makokha
;
Tobias Landmann
;
Bester Mudereri
;
Henri Tonnang
;
Thomas Dubois
(
2020-10
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Author
Bester Mudereri (1)
Elfatih Abdel-Rahman (1)
Godfrey Makokha (1)
Grace Aduvukha (1)
Henri Tonnang (1)
Sichangi, Arthur Wafula (1)
Thomas Dubois (1)
Tobias Landmann (1)
Date Issued
2020 (1)
Has File(s)
Yes (1)