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Fractal analysis of hillocks: A case of RF sputtered aluminum thin films

Mwema, Fredrick Madaraka; Akinlabi, Esther Titilayo; Oladijo, Oluseyi Philip (Applied Surface Science, 2019-05-29)

Now showing items 1-1 of 1

Author
- Akinlabi, Esther Titilayo (1)
- Mwema, Fredrick Madaraka (1)
- Oladijo, Oluseyi Philip (1)
Subject
- Aluminum thin films; hillocks; fractal dimension; image processing; multifractal; sputtering (1)
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Date Issued
- 2019 (1)
Has File(s)
- Yes (1)