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Atomic force microscopy analysis of surface topography of pure thin aluminum films
Mwema, Fredrick Madaraka
;
Oladijo, Oluseyi Philip
;
Sathiaraj, T.S.
;
Akinlabi, Esther Titilayo
(
Materials Research Express
,
2018-07
)
The Use of Power Spectrum Density for Surface Characterization of Thin Films
Mwema, Fredrick Madaraka
;
Akinlabi, Esther Titilayo
;
Oladijo, Oluseyi Philip
(
Photoenergy and Thin Film Materials
,
2019-03-25
)
Fractal analysis of hillocks: A case of RF sputtered aluminum thin films
Mwema, Fredrick Madaraka
;
Akinlabi, Esther Titilayo
;
Oladijo, Oluseyi Philip
(
Applied Surface Science
,
2019-05-29
)
Effect of varying low substrate temperature on sputtered aluminium films
Mwema, Fredrick Madaraka
;
Akinlabi, Esther Titilayo
;
Oladijo, Oluseyi Philip
;
Majumdar, Jyotsna Dutta
(
Materials Research Express
,
2019
)
Effect of Substrate Temperature on Aluminium Thin Films Prepared byRF-Magnetron Sputtering
Mwema, Fredrick Madaraka
;
Oladijo, Oluseyi Philip
;
Akinlabi, Esther Titilayo
(
Elsevier
,
2018-08
)
Properties of physically deposited thin aluminium film coatings: A review
Mwema, Fredrick Madaraka
;
Oladijo, Oluseyi Philip
;
Akinlabi, Stephen A
;
Akinlabi, Esther Titilayo
(
Journal of Alloys and Compounds
,
2018-03-01
)
Mechanical Behaviour of Sputtered Aluminium Thin Films under High Sliding Loads
Mwema, Fredrick Madaraka
;
Akinlabi, Esther Titilayo
;
Oladijo, Oluseyi Philip
(
Key Engineering Materials
,
2019-03-22
)
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Author
Akinlabi, Esther Titilayo (7)
Mwema, Fredrick Madaraka (7)
Oladijo, Oluseyi Philip (7)
Akinlabi, Stephen A (1)
Majumdar, Jyotsna Dutta (1)
Sathiaraj, T.S. (1)
Subject
aluminium, thin films, corrosion, electrical, optical, physical deposition, properties (1)
Aluminium; magnetron sputtering; roughness; substrate temperature; thin films (1)
Aluminium; thin films; sputtering; substrate temperature; wear (1)
Aluminum thin films; hillocks; fractal dimension; image processing; multifractal; sputtering (1)
AluminumThin film Surface roughnesssubstrate temperatureMagnetron sputteringAFM (1)
Atomic force microscopy, fourier transforms, power spectral density, surface roughness, thin films (1)
Atomic Force, Power Spectral Density (1)
... View More
Date Issued
2019 (4)
2018 (3)
Has File(s)
Yes (7)