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The Use of Power Spectrum Density for Surface Characterization of Thin Films

Mwema, Fredrick Madaraka; Akinlabi, Esther Titilayo; Oladijo, Oluseyi Philip (Photoenergy and Thin Film Materials, 2019-03-25)

Now showing items 1-1 of 1

Author
- Akinlabi, Esther Titilayo (1)
- Mwema, Fredrick Madaraka (1)
- Oladijo, Oluseyi Philip (1)
Subject
- Atomic force microscopy, fourier transforms, power spectral density, surface roughness, thin films (1)
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Date Issued
- 2019 (1)
Has File(s)
- Yes (1)