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Browsing by Subject "Atomic force microscopy, fourier transforms, power spectral density, surface roughness, thin films"

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Title: The Use of Power Spectrum Density for Surface Characterization of Thin Films Author: Mwema, Fredrick Madaraka; Akinlabi, Esther Titilayo; Oladijo, Oluseyi Philip Date: 2019-03-25

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